Remote Plasma Cleaning from a TEM Sample Holder with an Evactron De-Contaminator
Christopher G. Morgan, David Varley, and Ronald Vane, XEI Scientific, Inc., Redwood City, CA Poster Presentation at Microscopy and Microanalysis Meeting, August 2010, Portland, OR A new method for using the Evactron D-C to clean TEMs is reported. The RF electrode used...Upcoming Events
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Europe’s largest event dedicated to microscopy and imaging The European Microscopy Congress 2020 (emc2020) will be held in Copenhagen. It will bring the world of scientific imaging together in one of Europe’s most beautiful cities.[...]
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