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Contamination-Free Transmission Electron Microscopy for High-Resolution Carbon Elemental Mapping of Polymers

Contamination-Free Transmission Electron Microscopy for High-Resolution Carbon Elemental Mapping of Polymers

Shin Horiuchi*, Takeshi Hanada**, Masaharu Ebisawa**, Yasuhiro Matsuda***, Motoyasu Kobayashi***, and Atsushi Takahara***,*AIST, Ibaraki, Japan, **Consulting Zero Loss Imaging, Tokyo, Japan ***Institute for Materials Chemistry and Engineering, Fukuoka, Japan ACS Nano,...
Remote Plasma Cleaning from a TEM Sample Holder with an Evactron De-Contaminator

Remote Plasma Cleaning from a TEM Sample Holder with an Evactron De-Contaminator

Christopher G. Morgan, David Varley, and Ronald Vane, XEI Scientific, Inc., Redwood City, CA Poster Presentation at Microscopy and Microanalysis Meeting, August 2010, Portland, OR A new method for using the Evactron D-C to clean TEMs is reported. The RF electrode used...

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