Remote Plasma Cleaning from a TEM Sample Holder with an Evactron De-Contaminator
Christopher G. Morgan, David Varley, and Ronald Vane, XEI Scientific, Inc., Redwood City, CA Poster Presentation at Microscopy and Microanalysis Meeting, August 2010, Portland, OR A new method for using the Evactron D-C to clean TEMs is reported. The RF electrode used...Upcoming Events
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