Shin Horiuchi*, Takeshi Hanada**, Masaharu Ebisawa**, Yasuhiro Matsuda***, Motoyasu Kobayashi***, and Atsushi Takahara***,*AIST, Ibaraki, Japan, **Consulting Zero Loss Imaging, Tokyo, Japan ***Institute for Materials Chemistry and Engineering, Fukuoka, Japan ACS Nano,...
Christopher G. Morgan, David Varley, and Ronald Vane, XEI Scientific, Inc., Redwood City, CA Poster Presentation at Microscopy and Microanalysis Meeting, August 2010, Portland, OR A new method for using the Evactron D-C to clean TEMs is reported. The RF electrode used...
