Neal Sullivan*, Tung Mai*, Scott Bowdoin*, and Ronald Vane**, *Schlumberger Technologies, 45 Winthrop St., Concord, MA **XEI Scientific, Inc., Redwood City, CA
Presentation at Microscopy and Microanalysis Meeting, August, 2002, Quebec City, Canada (Microscopy& Microscroanalysis Vol. 8, Supplement 2, 720CD)
A complete paper with CD SEM data.