Ronald Vane and Vince Carlino, XEI Scientific, Inc., Redwood City, CA
Presentation at Microscopy and Microanalysis Meeting, August, 2005, Honolulu, HI
Hydrocarbon (HC) background and contamination is hard to avoid in our carbon based world. Even with the most careful handling carbon contamination artifacts from Airborne Molecular Contamination (AMC) can creep in and interfere with imaging and measurement in e-beam instruments. The Evactron De-Contaminator made by XEI Scientific is a tool that actively removes HC from the vacuum system and specimens within it to prevent these problems.
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