Correlating Atom Probe Crystallographic Measurements with Transmission Kikuchi Diffraction Data

Andrew J. Breen, Katharina Babinsky, Alec C. Day, K. Eder, Connor J. Oakman, Patrick W. Trimby,Sophie Primig, Julie M. Cairney and Simon P. Ringer ABSTRACT: Correlative microscopy approaches offer synergistic solutions to many research problems. One such combination,...

A Study of the Effects of Evactron® Plasma Cleaning on X-ray Windows

Ronald Vane*, Christine Roberts**, and Vince Carlino* *XEI Scientific, Inc., Redwood City, CA 94063 **Formerly with MOXTEK, Inc., Orem, UT 84057 Presentation at Microscopy and Microanalysis Meeting, August, 2004, Savannah, GA A complete paper showing that long term...

Effect of Evactron® Cleaning on EBSD Detector Phosphor Screens

Mark Nave* and Andrew Sullivan**, *Microanalysis Consulting Pty. Ltd., St Albans Park, Victoria, Australia **Centre for Material and Fibre Innovation, Deakin University, Geelong, Victoria, Australia View PDF document...

Improved Carbon Analysis with Evactron Plasma Cleaning

Pierre Rolland*, Vincent L. Carlino**, and Ronald Vane**, *Alprimage, 11 rue de Savoie, 91940 Les Ulis, France, **XEI Scientific, 1735 East Bayshore Rd., Suite 29A, Redwood City, CA 94063, USA Presentation at Microscopy and Microanalysis Meeting, August, 2004,...