Elevated temperature transmission Kikuchi diffraction in the SEM

Elevated temperature transmission Kikuchi diffraction in the SEM

Alice Bastos Fanta⁎, Matteo Todeschini, Andrew Burrows, Henri Jansen, Christian D. Damsgaard, Hossein Alimadadi, Jakob B. Wagner ABSTRACT: Transmission Kikuchi diffraction (TKD) facilitates automated orientation mapping of thin films in scanning electron microscopes...
Improved Carbon Analysis with Evactron Plasma Cleaning

Improved Carbon Analysis with Evactron Plasma Cleaning

Pierre Rolland*, Vincent L. Carlino**, and Ronald Vane**, *Alprimage, 11 rue de Savoie, 91940 Les Ulis, France, **XEI Scientific, 1735 East Bayshore Rd., Suite 29A, Redwood City, CA 94063, USA Presentation at Microscopy and Microanalysis Meeting, August, 2004,...