ABSTRACT: Ultrathin metallic films are important functional materials for optical and microelectronic devices. Dedicated characterization with high spatial resolution and sufficient field of view is key to the understanding of the relation between microstructure and...
Barbara Armbruster, Michael Cable, Ewa Kosmowska, Kim Larsen, Patrick Trimby and Ronald Vane ABSTRACT: Plasma cleaners have been recognized as a necessary accessory for rapidly and effectively eliminating hydrocarbon contamination from vacuum chambers and samples....
Alice Bastos S. Fanta, Adam Fuller, Hossein Alimadadi, Matteo Todeschini, Daniel Goran, Andrew Burrows ABSTRACT: Transmission Kikuchi Diffraction (TKD) in the scanning electron microscope has been developing at a fast pace since its introduction less than a decade...
Alice Bastos Fanta⁎, Matteo Todeschini, Andrew Burrows, Henri Jansen, Christian D. Damsgaard, Hossein Alimadadi, Jakob B. Wagner ABSTRACT: Transmission Kikuchi diffraction (TKD) facilitates automated orientation mapping of thin films in scanning electron microscopes...
Andrew J. Breen, Katharina Babinsky, Alec C. Day, K. Eder, Connor J. Oakman, Patrick W. Trimby,Sophie Primig, Julie M. Cairney and Simon P. Ringer ABSTRACT: Correlative microscopy approaches offer synergistic solutions to many research problems. One such combination,...
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